1. Mac Crackin, Frank L.
  2. A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films

A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films

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A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films

A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films (Ver registro completo)

Libro
Título A Fortran program for analysis of ellipsometer measurements and calculation of reflection coefficients from thin films ;Frank L. Mc Crackin and James P. Colson ;
Lugar de publicación Washington
Editorial [s.n.]
Fecha de publicación 1964

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